Analysis of the EMCCD point-source response using x-rays

Electron Multiplying Charge Coupled Devices, EMCCD are used as x-ray detectors. The NSLS-II Soft Inelastic Scattering (SIX) beam line has two EMCCDs for detection in the spectrometer arm. with high resolving power disperses x-rays vertically. vertical position on sensor plane is related to its energy. This allows very accurate energy measurements through coordinates. X-rays interact silicon and create a number of electron–hole pairs proportional Electrons drift diffuse toward pixel gates collected there. diffused electrons form charge cloud distributed over several neighboring pixels. sharing enables coordinate accuracy better than pitch. distribution shape be taken into account achieve ultimate measurements. In this paper, we present method analysis demonstrate applications. diffusion from point generation results bell-shaped electron usually approximated by Gaussian shape. under function integral. These packets get transferred sense node output amplifier. transfer process could introduce distortions original distribution. For example, during transfers, packet exposed traps if they sensor. trapping later release processes distort apparent Therefore, deviations originally symmetrical can indicate presence trap centers diagnostics.